Alphabetical Index

Additional Indexes

Physical Constants Units of Measure Physical Quantities SI Prefixes Ring Index General Formulae Exact Formulae Source Documents Terms by IUPAC Div.

Version 3.0.1 (8049 Terms)

DOI: 10.1351/goldbook

Jan Kaiser - Content Editor
Stuart Chalk - Technical Editor
Joint Subcommittee
on the IUPAC Gold Book

Terms (273) sourced from: 10.1515/pac-2019-0404

"Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)", Takeuchi, T.; McQuillan, A.J.; Shard, A.; Russell, A.E.; Hibbert, D.B., Pure and Applied Chemistry 2020, 92(11), 1781

Auger electron spectrum Auger neutralization Auger parameter Auger photoelectron coincidence spectroscopy Auger spectroscopy Auger vacancy satellite absolute elemental sensitivity factor absorption length adventitious carbon referencing aligned incidence spectrum altered layer analyser blanking analysis area analysis area angle lapping angle of emission areic dose areic dose rate areic surface energy asymmetry parameter atomic mixing attenuated total reflection infrared spectroscopy average beam current average matrix relative sensitivity factor

Bragg’s rule backscattered electron backscattering correction factor backscattering energy backscattering fraction backscattering spectrum backscattering yield ball cratering beam bunching beam chopper beam footprint beam spill-off binary elastic scattering binary elastic scattering peak blocking geometry buncher

cascade mixing channeling characteristic electron energy losses charge neutralization charge referencing charging potential chemical map chemical state chemical state plot chromatic aberration collision cascade compositional depth profile crater depth cross-sectioning

damage limit delayed onset delta layer depth profiling depth resolution parameter desorption atmospheric pressure chemical ionization mass spectrometry desorption atmospheric pressure photoionization mass spectrometry desorption electrospray ionization mass spectrometry differential spectrum diffuse reflection-absorption infrared spectroscopy dilute limit direct analysis in real time direct recoil spectroscopy direct spectrum disappearance cross section dispersion plane dual-beam profiling dynamic emittance matching dynamic secondary-ion mass spectrometry

Einstein photoelectric equation effective attenuation length elastic peak elastic peak electron spectroscopy elastic scattering cross section electron energy analyser electron energy loss spectrum electron flooding electron inelastic mean free path electron retardation electron spectrometer electronic stopping cross section electrospray laser desorption ionization mass spectrometry elemental map elemental relative sensitivity factor ellipsometry energy edge enhanced elastic cross section erosion rate experimental scattered-ion intensity extended X-ray absorption fine structure spectroscopy extraction field extractive electrospray ionization mass spectrometry extractor voltage extrinsic plasmon

Fermi level referencing fast-atom bombardment secondary ion mass spectrometry field-induced migration final energy state flux of a beam of particles focused ion beam system fractional ion yield fractional sputtering yield

G-SIMS G-SIMS with fragmentation pathway mapping g index grazing-incidence small-angle X-ray scattering analysis

image depth profile impact energy implanted areic dose inelastic electron scattering background inelastic electron scattering background subtraction inelastic scattering cross section information depth information radius initial energy state initial energy state initial-state Auger parameter instrumental depth resolution interatomic Auger process interface core-level shift intrinsic plasmon ion beam ion beam ratio ion implantation ion-scattering spectrum

kinematic factor

laser ablation electrospray ionization mass spectrometry line scan liquid-metal ion gun low-energy ion scattering spectrometry

mass accuracy matrix factor matrix-assisted laser desorption electrospray ionization mass spectrometry matrix-assisted laser desorption/ionization mass spectrometry mean escape depth medium-energy ion scattering spectrometry metastable background modified Auger parameter molecular fragment molecular image

negative-ion yield nuclear reaction cross section nuclear stopping cross section

observed interface width off-specular X-ray reflectometry

partial ion yield partial sputtering yield pass energy peak energy photoelectric work function photoelectron X-ray satellite peaks photoelectron X-ray satellite subtraction photoemission photoionization cross section pileup plasma assisted desorption ionization mass spectrometry plasmon polyatomic fragment positive-ion yield preferential sputtering primary beam primary ion probe ion projected range pulse rate pulse width pulsed extraction field pure-element relative sensitivity factor

Rutherford backscattering spectrometry Rutherford cross section radial sectioning random incidence spectrum range straggling raster reactive desorption electrospray ionization mass spectrometry redeposition reflection-absorption infrared spectroscopy reflector voltage relative instrument spectral response function relative isotopic sensitivity factor relative mass accuracy relative resolution relative sputtering rate relaxation energy repetition rate resonance reaction

SIMS ion image Shirley background sample bias sample charging sample voltage scanning near-field optical microscopy scattered-ion energy scattered-ion energy ratio screening screening function secondary ion secondary-electron yield secondary-electron yield secondary-ion angular distribution secondary-ion energy distribution secondary-ion mass spectrometry secondary-ion yield selected-area aperture shakeoff shakeup shots per pixel small-angle X-ray scattering solid angle of analyser spectator hole spectrometer response function spectrometer transmission function specular X-ray reflectrometry sputter depth profile sputtering rate sputtering yield standard vacuum level static limit static secondary-ion mass spectrometry steady-state sputtering steady-state surface composition sputtering stoichiometric sputtering stop event stopping cross section stopping cross section factor sub-shell photoionization cross section sum frequency generation spectroscopy surface approximation energy surface core-level shift surface excess amount surface extended X-ray absorption fine structure spectroscopy surface map surface plasmon surface plasmon resonance surface segregation surface-assisted laser desorption/ionization mass spectrometry surface-enhanced infrared spectroscopy surface-enhanced raman spectroscopy surface-enhanced resonant Raman spectroscopy swift ion system resolution

Tougaard background take-off angle theoretical scattered-ion intensity thermionic work function thin target tip enhanced raman spectroscopy topographic contrast total ion yield total reflection X-ray fluorescence spectroscopy total reflection of X-rays total secondary-electron yield transformation probability

ultra-shallow depth profile useful ion yield useful spatial resolution

vacuum level vacuum level at infinity vacuum level referencing valence-band spectrum volume yield

wave vector

X-ray absorption fine structure spectroscopy X-ray absorption near-edge spectroscopy X-ray jump ratio X-ray linewidth X-ray monochromator X-ray reflectometry X-ray standing waves