https://doi.org/10.1351/goldbook.09240
Average depth of the region of a crater from which the measured signal is derived.
Notes:
- The crater is generally formed by ion bombardment in sputter depth profiling and, in this case, can be different from the thickness of sample material removed by sputtering due to dilation of the altered layer.
- The crater depth can be modified by the formation of a reacted layer (e.g. an oxide) following any exposure to the atmosphere or other environments necessary when conducting the crater depth measurement.