https://doi.org/10.1351/goldbook.09334
Intensity distribution in a spectrum for particles originally at one energy but which are emitted at lower energies due to one or more inelastic scattering processes.
Note: For Auger electron spectroscopy and X-ray photoelectron spectroscopy, the inelastic background associated with a particular Auger electron or photoelectron peak has been approximated by a measured electron energy loss spectrum for which the incident-electron energy is close to the energy of the peak. Simple linear backgrounds have also been used, but these are much less accurate, except for the XPS analysis of insulators.