total reflection X-ray fluorescence spectroscopy

initialism: TXRF
https://doi.org/10.1351/goldbook.09211
Measurement method in which an X-ray spectrometer is used to measure the energy distribution of fluorescence X-rays emitted from a surface irradiated by primary X-rays under the condition of total reflection.
Source:
PAC, 2020, 92, 1781. (Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)) on page 1794 [Terms] [Paper]
Citation: 'total reflection X-ray fluorescence spectroscopy' in IUPAC Compendium of Chemical Terminology, 5th ed. International Union of Pure and Applied Chemistry; 2025. Online version 5.0.0, 2025. https://doi.org/10.1351/goldbook.09211 RIS BibTex EndNote
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