negative-ion yield

https://doi.org/10.1351/goldbook.09410
Number of negatively-charged secondary ions sputtered from a sample divided by total number of incident primary particles.
Source:
PAC, 2020, 92, 1781. (Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)) on page 1842 [Terms] [Paper]