Alphabetical Index

Additional Indexes

Physical Constants Units of Measurement Physical Quantities SI Prefixes Ring Index General Formulae Exact Formulae Source Documents Terms by IUPAC Division Terms by Organization

Version 5.0.0 (14588 Terms)

DOI: 10.1351/goldbook

Jan Kaiser - Content Editor
Stuart J. Chalk - Technical Editor
Joint Subcommittee
on the IUPAC Gold Book

Terms (273) sourced from: 10.1515/pac-2019-0404

"Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)", Takeuchi, T.; McQuillan, A.J.; Shard, A.; Russell, A.E.; Hibbert, D.B., Pure and Applied Chemistry 2020, 92(11), 1781

Auger electron spectrum Auger neutralization Auger parameter Auger photoelectron coincidence spectroscopy Auger spectroscopy Auger vacancy satellite absolute elemental sensitivity factor absorption length in X-ray reflectrometry adventitious carbon referencing aligned incidence spectrum altered layer analyser blanking in secondary-ion mass spectrometry analysis area of sample analysis area of spectrometer angle lapping angle of emission areic dose (\(D\))areic dose rate (\(G\))areic surface energy asymmetry parameter (\(\beta\))atomic mixing attenuated total reflection infrared spectroscopy average beam current (\(I_{\rm{av}}\))average matrix relative sensitivity factor in electron spectroscopy

Bragg’s rule backscattered electron backscattering correction factor backscattering energy backscattering fraction (\(r\))backscattering spectrum backscattering yield (\(\eta\))ball cratering beam bunching in secondary-ion mass spectrometry beam chopper beam footprint in X-ray reflectrometry beam spill-off in X-ray reflectrometry binary elastic scattering binary elastic scattering peak blocking geometry buncher

cascade mixing cationized molecule channeling characteristic electron energy losses charge neutralization charge referencing charging potential chemical map chemical state in electron spectroscopy chemical state plot chromatic aberration collision cascade compositional depth profile crater depth cross-sectioning

damage limit delayed onset in an X-ray absorption spectrum delta layer depth profiling depth resolution parameter desorption atmospheric pressure chemical ionization mass spectrometry desorption atmospheric pressure photoionization mass spectrometry desorption electrospray ionization mass spectrometry differential spectrum diffuse reflection-absorption infrared spectroscopy dilute limit in secondary-ion mass spectrometry direct analysis in real time direct recoil spectroscopy direct spectrum disappearance cross section dispersion plane in X-ray reflectrometry dual-beam profiling dynamic emittance matching dynamic secondary-ion mass spectrometry

Einstein photoelectric equation effective attenuation length elastic peak elastic peak electron spectroscopy elastic scattering cross section (\(\sigma_{\rm{e}}\))electron energy analyser electron energy loss spectrum electron flooding electron inelastic mean free path electron retardation electron spectrometer electronic stopping cross section electrospray laser desorption ionization mass spectrometry elemental map elemental relative sensitivity factor ellipsometry energy edge enhanced elastic cross section erosion rate of a surface experimental scattered-ion intensity extended X-ray absorption fine structure spectroscopy extraction field extractive electrospray ionization mass spectrometry extractor voltage in secondary ion mass spectrometry extrinsic plasmon

Fermi level referencing fast-atom bombardment secondary ion mass spectrometry field-induced migration final energy state flux of a beam of particles (\(\mathit{\Phi}\))focused ion beam system fractional ion yield fractional sputtering yield

G-SIMS G-SIMS with fragmentation pathway mapping g index in G-SIMS grazing-incidence small-angle X-ray scattering analysis

image depth profile impact energy implanted areic dose (\(D_{\rm{imp}}\))inelastic electron scattering background inelastic electron scattering background subtraction inelastic scattering cross section information depth information radius initial energy state in X-ray photoelectron spectroscopy initial energy state in Auger electron spectroscopy initial-state Auger parameter (\(\beta\))instrumental depth resolution interatomic Auger process interface core-level shift intrinsic plasmon ion beam ion beam ratio ion implantation ion-scattering spectrum

kinematic factor (\(K\))

laser ablation electrospray ionization mass spectrometry line scan liquid-metal ion gun low-energy ion scattering spectrometry

mass accuracy matrix factor matrix-assisted laser desorption electrospray ionization mass spectrometry matrix-assisted laser desorption/ionization mass spectrometry mean escape depth medium-energy ion scattering spectrometry metastable background in secondary-ion mass spectrometry modified Auger parameter molecular fragment molecular image

negative-ion yield nominal mass nuclear reaction cross section nuclear stopping cross section

observed interface width off-specular X-ray reflectometry

partial ion yield partial sputtering yield pass energy in electron spectroscopy peak energy photoelectric work function (\(\phi_{\rm{o}}\))photoelectron X-ray satellite peaks photoelectron X-ray satellite subtraction photoemission photoionization cross section pileup plasma assisted desorption ionization mass spectrometry plasmon polyatomic fragment positive-ion yield preferential sputtering primary beam primary ion probe ion projected range pulse rate in secondary-ion mass spectrometry pulse width in secondary-ion mass spectrometry pulsed extraction field pure-element relative sensitivity factor

Rutherford backscattering spectrometry Rutherford cross section radial sectioning random incidence spectrum range straggling raster reactive desorption electrospray ionization mass spectrometry redeposition reflection-absorption infrared spectroscopy reflector voltage reflectron relative instrument spectral response function relative isotopic sensitivity factor relative mass accuracy relative resolution of a spectrometer relative sputtering rate relaxation energy in X-ray photoelectron spectroscopy resonance reaction

SIMS ion image Shirley background sample bias sample charging sample voltage scanning near-field optical microscopy scattered-ion energy scattered-ion energy ratio screening screening function secondary ion secondary-ion angular distribution secondary-ion energy distribution secondary-ion mass spectrometry secondary-ion yield selected-area aperture self-assembled monolayer shakeoff shakeup shots per pixel in secondary-ion mass spectrometry small-angle X-ray scattering solid angle of analyser spectator hole spectrometer response function spectrometer transmission function specular X-ray reflectrometry sputter depth profile sputtering rate sputtering yield standard vacuum level static limit in secondary-ion mass spectrometry static secondary-ion mass spectrometry steady-state sputtering steady-state surface composition sputtering stoichiometric sputtering stop event in secondary-ion mass spectrometry stopping cross section (\(S(E)\))stopping cross section factor sub-shell photoionization cross section sum frequency generation spectroscopy surface approximation energy surface core-level shift surface excess amount (\(n^{\sigma}\))surface extended X-ray absorption fine structure spectroscopy surface map surface plasmon surface plasmon resonance surface segregation surface-assisted laser desorption/ionization mass spectrometry surface-enhanced infrared spectroscopy surface-enhanced resonant Raman spectroscopy swift ion system resolution

Tougaard background take-off angle theoretical scattered-ion intensity (\(I_{\rm{i}}(\theta)\))thermionic work function (\(W\))thin target tip enhanced raman spectroscopy topographic contrast total ion yield total reflection X-ray fluorescence spectroscopy total reflection of X-rays total secondary-electron yield (\(\sigma\))transformation probability

ultra-shallow depth profile useful ion yield useful spatial resolution in secondary-ion mass spectrometry

vacuum level (\(E_{\rm{VAC}}\))vacuum level at infinity (\(E_{\rm{VAC}}(\infty)\))vacuum level referencing valence-band spectrum volume yield

wave vector (\(k\)) in X-ray reflectrometry

X-ray absorption fine structure spectroscopy X-ray absorption near-edge spectroscopy X-ray jump ratio X-ray linewidth X-ray monochromator X-ray reflectometry X-ray standing waves