Intensity distribution in a spectrum for particles originally at one energy but which are emitted at lower energies due to one or more inelastic scattering processes.
Note: For
Auger electron spectroscopy and X-ray photoelectron spectroscopy, the inelastic background associated with a particular
Auger electron or photoelectron peak has been approximated by a measured
electron energy loss spectrum for which the incident-electron energy is close to the energy of the peak. Simple linear backgrounds have also been used, but these are much less accurate, except for the XPS analysis of insulators.
See also: inelastic electron scattering background subtraction, Tougaard background, Shirley background
Source:
PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1826 (https://doi.org/10.1515/pac-2019-0404)