Measurement method in which an X-ray spectrometer is used to measure the energy distribution of fluorescence X-rays emitted from a surface irradiated by primary X-rays under the condition of total reflection.
Source: PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1794 (https://doi.org/10.1515/pac-2019-0404)