secondary ionization

in mass spectrometry
https://doi.org/10.1351/goldbook.S05522
The process in which ions are ejected from a sample surface (which may be a solid or substrate dissolved in a solvent matrix) as a result of bombardment by a primary beam of atoms or ions.
Source:
PAC, 1991, 63, 1541. (Recommendations for nomenclature and symbolism for mass spectroscopy (including an appendix of terms used in vacuum technology). (Recommendations 1991)) on page 1548 [Terms] [Paper]
Citation: 'secondary ionization' in IUPAC Compendium of Chemical Terminology, 3rd ed. International Union of Pure and Applied Chemistry; 2006. Online version 3.0.1, 2019. https://doi.org/10.1351/goldbook.S05522 RIS BibTex EndNote
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Last revised: February 24, 2014