Amount of radiation per unit area to which a resist is exposed.
Note: For optical lithography, exposure dose is reported in \(\pu{mJ cm^{-2}}\), while for electron beam lithography, exposure dose is reported in \(\pu{\upmu\!C cm^{-2}}\).
Source: PAC, 2020, 92, 1861. 'Terminology of polymers in advanced lithography (IUPAC Recommendations 2020)' on page 1872 (https://doi.org/10.1515/pac-2018-1215)