Extraction field around the sample that is pulsed to the working value for extracting ions for the time necessary for operation of a time-of-flight mass spectrometer, but is otherwise at a low value.
Note: This is the usual mode in time-of-flight
secondary ion mass spectrometry systems, either for studying insulators, where charge neutralization is established while the extraction field is off, or for
depth profiling using a second ion beam while the extraction field is off.
Source:
PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1843 (https://doi.org/10.1515/pac-2019-0404)