https://doi.org/10.1351/goldbook.08771
Measurement method using diffraction of X-radiation to obtain the spatial arrangement of atoms in a crystalline sample.
Notes:
- Bragg reflection follows \(n\lambda = 2 d \sin \theta\), where \(\lambda\) is the X-ray wavelength, \(d\) is the spacing between atomic planes, and \(\theta\) is the angle of diffraction.
- Copper \(\rm{K}\upalpha_1\) radiation (\(\lambda = \pu{0.15406 nm}\), \(E = \pu{8.04 keV}\)) is typically used for routine XRD.