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Physical ConstantsUnits of MeasurementPhysical QuantitiesSI PrefixesRing IndexGeneral FormulaeExact FormulaeSource DocumentsTerms by IUPAC DivisionTerms by Organization
Version 5.0.0 (14588 Terms)
DOI: 10.1351/goldbook
Jan Kaiser - Content Editor
Stuart J. Chalk - Technical Editor
Joint Subcommittee
on the IUPAC Gold Book

Terms (20) sourced from: 10.1351/pac197951112243

"General aspects of trace analytical methods—IV. Recommendations for nomenclature, standard procedures and reporting of experimental data for surface analysis techniques", Analytical Chemistry Division, Pure and Applied Chemistry 1979, 51(11), 2243

Auger electron yield
chemical shift in photoelectron and Auger spectraclean surfaceconcentration in experimental surface
depth profiledepth resolution
escape depth for surface analysis techniques
ion probe microanalysision scattering spectrometry
matrix effect in surface analysis
photoelectron yield
qualitative elemental specificity in analysis
Rutherford backscatteringrelative detection limit
sputter yieldsputteringsurfacesurface contamination in surface analysissurface coverage
trace element
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