secondary electron yield

in in situ microanalysis
https://doi.org/10.1351/goldbook.S05519
The number of @S05518@ generated per @P04829@ for a given specimen and experimental conditions. It depends on the (mean) @A00499@ of the excited area of the sample, the @A00346@ between electron beam and sample surface, the primary electron energy, thickness of the sample and sample potentials.
Source:
PAC, 1983, 55, 2023. (Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)) on page 2026 [Terms] [Paper]
Citation: 'secondary electron yield' in IUPAC Compendium of Chemical Terminology, 3rd ed. International Union of Pure and Applied Chemistry; 2006. Online version 3.0.1, 2019. https://doi.org/10.1351/goldbook.S05519 RIS BibTex EndNote
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Last revised: February 24, 2014