https://doi.org/10.1351/goldbook.14251
Average periodicity (repeating distance) of the layers of lamellar crystals in a stacked assembly.
Note: The long period is usually measured by SAXS (small-angle X-ray scattering), SANS (small-angle neutron scattering), atomic force microscopy (AFM), or transmission electron microscopy (TEM), and is the sum of the average thickness of the lamellar crystals and the average thickness of the amorphous inter-lamellar region.