In
secondary-ion mass spectrometry, electric field above a sample, operational during ion emission from the sample.
Note: The extraction field can be pulsed or constant, depending on the type of instrument.
Source:
PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1838 (https://doi.org/10.1515/pac-2019-0404)