Tougaard background

https://doi.org/10.1351/goldbook.09360
In Auger electron spectroscopy and X-ray photoelectron spectroscopy, intensity distribution of the background due to inelastic scattering obtained from the differential inelastic scattering cross section with respect to energy loss and the three-dimensional distribution of the emitting atoms in the surface region.
Notes:
  1. A number of classes of atomic distributions can be used together with different differential inelastic scattering cross sections. The atomic distribution and the inelastic scattering cross section should be specified.
  2. The Tougaard background is usually calculated to match the measured spectrum over a wide energy range that excludes the peak region and the spectral region extending to approximately \(\pu{50 eV}\) less kinetic energy than the peaks of interest. The measured spectrum should be corrected for the spectrometer response function of the measuring instrument before the calculation of the Tougaard background.
See also: Shirley background
Source:
PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1831 (https://doi.org/10.1515/pac-2019-0404)