Subtraction of a chosen
inelastic electron scattering background from a measured spectrum in
Auger electron spectroscopy and X-ray photoelectron spectroscopy.
Note: The inelastic background associated with a particular Auger electron or photoelectron peak has been approximated by a measured
electron energy loss spectrum for which the incident-electron energy is close to the energy of the peak.
Source:
PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1826 (https://doi.org/10.1515/pac-2019-0404)