In
dynamic secondary-ion mass spectrometry, coefficient for an element by which the measured intensity of a mass peak for that element, divided by the measured intensity of a mass peak for the matrix, is multiplied to yield the atomic concentration of the element present in the sample.
Notes: - The elemental relative sensitivity factor can be obtained by dividing the relative isotopic sensitivity factor by the isotope abundance of the detected isotope ion.
- Matrix terms are strong, and the matrix, bombarding species, incident-ion energy, and angle of incidence, as well as the spectrometer operating conditions, all affect relative elemental sensitivity factors significantly.
Source:
PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1825 (https://doi.org/10.1515/pac-2019-0404)