Energy spectrum of electrons from a nominally monoenergetic source emitted after inelastic interactions with the sample, often exhibiting peaks due to specific inelastic loss processes (see
characteristic electron energy losses and
plasmon).
Notes: - The electron energy loss spectrum obtained using an incident-electron beam of about the same energy as a peak obtained in Auger electron spectroscopy or X-ray photoelectron spectroscopy approximates to the energy loss spectrum associated with that peak.
- The electron energy loss spectrum, measured with an incident-electron beam, is a function of beam energy, angle of incidence of the beam, angle of emission, and the electronic properties of the sample.
Source:
PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1824 (https://doi.org/10.1515/pac-2019-0404)