In
Auger electron spectroscopy (AES),
secondary-ion mass spectrometry, and X-ray photoelectron spectroscopy, the
spectrometer response function divided by the response function of a reference instrument, or the average for several such instruments, as a function of energy (AES, XPS, etc.) or mass (SIMS).
Note: The RISR can be used to relate spectra from one instrument to spectra from another when using similar excitation sources and geometries.
Source:
PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1811 (https://doi.org/10.1515/pac-2019-0404)