Measurement method based on the interference of X-rays that occurs near the Bragg condition at the surface of a crystalline solid, which leads to intensity maxima in yields of photoelectrons as the Bragg condition is scanned by tilting the sample.
Notes: - Intensity nodes are scanned from one lattice plane to the next as the sample is tilted. Atomic positions in the crystalline lattice can be determined from comparisons of measured scans of photoelectron intensity versus tilt angle with calculated scans from dynamical scattering theory.
- For defect-rich substrates, such as metal single crystals, a normal-incidence or back-reflection geometry may be used. Instead of rocking the crystal in space, the energy of the incident beam is tuned through the Bragg condition.
Source:
PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1795 (https://doi.org/10.1515/pac-2019-0404)