Extended X-ray absorption fine structure spectroscopy in which, instead of measuring X-ray absorption, electron emission arising from that absorption is measured.
Notes: - Emitted electrons include Auger electrons and secondary electrons.
- The detection of emitted electrons provides greater surface sensitivity than is generally found with extended X-ray absorption fine structure measurements.
Source:
PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1793 (https://doi.org/10.1515/pac-2019-0404)