Mode of
X-ray reflectrometry in which the angle between the detected beam and the sample surface is equal to that of the incident beam and the sample surface.
Notes: - Specular XRR is the plainary mode for XRR and is often meant when the term XRR is used.
- In this case, the angle scattering \(2 \theta\) is twice the incidence angle, \(\omega\). The detected, scattered X-ray intensity is measured as a function of either \(\omega\) or \(2 \theta\) or the scattering vector, \(q_{\rm{z}}\). The intensity data are usually presented as a function of \(q_{\rm{z}}\) or \(\omega\).
See also: off-specular X-ray reflectrometry
Source:
PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1792 (https://doi.org/10.1515/pac-2019-0404)