Method of
secondary-ion mass spectrometry using low current densities for analysis of sample surface components, in contrast with
dynamic secondary-ion mass spectrometry, which is used for analysis of components in the depth direction.
Notes: - When the sample is an organic molecule in solid form, the term is often changed to organic SIMS or molecular SIMS.
- The ion areic dose during measurement is restricted to less than \(\pu{E16}\) ions per \(\pu{m2}\) to an extent that depends on both the material of the sample and the size of the molecular fragments being analysed.
- Ions are usually detected by a time of flight mass spectrometer (TOF-SIMS).
Source:
PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1789 (https://doi.org/10.1515/pac-2019-0404)